Modelling the bonding at metal-ceramic interfaces using PEELS in the STEMBRYDSON, R; BRULEY, J; MÜLLEJANS, H et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 81-92, issn 0304-3991Conference Paper

An imaging filter for biological applicationsKRIVANEK, O. L; FRIEDMAN, S. L; GUBBENS, A. J et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 267-282, issn 0304-3991Conference Paper

Delocalization in inelastic scatteringMULLER, D. A; SILCOX, J.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 195-213, issn 0304-3991Conference Paper

Review of methods for calculating near edge structureREZ, P; BRULEY, J; BROHAN, P et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 159-167, issn 0304-3991Conference Paper

Development of the EXELFS technique for high accuracy structural informationQIAN, M; SARIKAYA, M; STERN, E. A et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 137-147, issn 0304-3991Conference Paper

Conduction bandstructure in strained silicon by spatially resolved electron energy loss spectroscopyBATSON, P. E.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 63-70, issn 0304-3991Conference Paper

Measurement of TEM primary energy with an electron energy-loss spectrometerMEYER, C. E; BOOTHROYD, C. B; GUBBENS, A. J et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 283-285, issn 0304-3991Conference Paper

Quantitative surface chemical mapping with Auger and backscattered electron signalsPRUTTON, M; BARKSHIRE, I. R; CRONE, M et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 47-62, issn 0304-3991Conference Paper

Cryo-electron energy loss spectroscpy: observations on vitrified hydrated specimens and radiation damageLEAPMAN, R. D; SUN, S.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 71-79, issn 0304-3991Conference Paper

Imaging of nanometer-sized precipitates in solids by electron spectroscopy imagingHOFER, F; WARBICHLER, P; GROGGER, W et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 15-31, issn 0304-3991Conference Paper

Some practical consequences of the Lorentzian angular distribution of inelastic scatteringEGERTON, R. F; WONG, K.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 169-180, issn 0304-3991Conference Paper

Analyzing line scan EELS data with neural pattern recognitionGATTS, C; DUSCHER, G; MÜLLEJANS, H et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 229-239, issn 0304-3991Conference Paper

Energy-filtered convergent-beam diffraction: examples and future prospectsMIDGLEY, P. A; SAUNDERS, M; VINCENT, R et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 1-13, issn 0304-3991Conference Paper

A quantitative approach for spatially-resolved electron energy-loss spectroscopy of grain boundaries and planar defects on a subnanometer scaleGU, H; CEH, M; STEMMER, S et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 215-227, issn 0304-3991Conference Paper

Energy-filtered transmission electron microscopy of Si_mGein superlattices and Si-Ge heterostructures. I: experimental resultsJÄGER, W; MAYER, J.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 33-45, issn 0304-3991Conference Paper

Momentum dependent energy loss near edge structures using a CTEM: the reliability of the methods availableBOTTON, G. A; BOOTHROYD, C. B; STOBBS, W. M et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 93-107, issn 0304-3991Conference Paper